周惠久论坛——Revealing morphological insights on organic semiconductors using charge transport measurements
讲座名称:周惠久论坛——Revealing morphological insights on organic semiconductors using charge transport measurements
时间:2026-05-14 10:00
地点:兴庆校区 仲英楼 第一会议室(A245-247)
讲座人:苏树江教授于美国汉密尔顿学院获得学士学位,后在美国康奈尔大学取得物理学博士学位。他曾于多伦多大学化学系从事博士后研究,之后加入香港浸会大学物理系,现为该系系主任及物理学教授。他的研究兴趣涵盖薄膜材料的物理与化学特性,包括有机薄膜中的电荷输运、热传导及缺陷研究,以及高性能有机太阳能电池和薄膜晶体管制备。苏教授论文总引用超1万1千次,H因子为58。
讲座介绍:The morphological analysis of the active layer stands as a critical imperative for advancing the performance of future organic solar cells or any organic electronic devices. Conventional characterization tools employed for morphological investigation often require substantial resources, both in cost and physical space, thereby imposing restraints on research endeavours in this domain. In this talk, we explore the application of charge carrier transport characterization beyond conventional mobility assessments, utilizing it as a table-top method for preliminary morphological screening in organic thin films. Examples of investigation will include some classic materials as well as on several high-performance BHJ systems that utilize well-developed “Y” non-fullerene acceptors. Temperature- and field-dependent transport characterizations have been analyzed with disorder model to extract key transport parameters, specifically the high-temperature limited mobility and positional disorder. Integrating these transport parameters with morphological insights obtained through various characterization tools including x-ray scattering, optical spectroscopies—provides connections between charge transport properties and morphological characteristics. Our findings point to the promising potential of utilizing a simple transport characterization technique for the early-stage evaluation of thin film packing and geometric properties of organic materials.
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